EMC 2008 - 14th European Microscopy Congress

Activity: Participating in or organising an event typesParticipation in conference


"HRTEM and STXM, a combined study of an individual focused-ion-beam patterned CNT" A. Felten, X. Ke, S. Bals, X. Gillon, J.J. Pireaux, E. Najafi, A.P. Hitchcock, C. Bittencourt, G. Van Tendeloo "STXM-NEXAFS of individual titanate-based nanoribbon" C.
Period1 Sept 20085 Sept 2008
Event typeConference
LocationAachen, GermanyShow on map