AVS 53rd International Symposium

  • Roumen Vitchev (Contributor)

Activity: Participating in or organising an event typesParticipation in conference

Description

Transient effects during Cs/Ga dual beam ToF-SIMS profiling: experiment and simulation. Co-auteurs : J. Brison et L. Houssiau.
Period12 Nov 200617 Nov 2006
Event typeConference
LocationSan Francisco, Etats-UnisShow on map