AVS 51st International Symposium

  • Ammar Azioune (Contributor)

Activity: Participating in or organising an event typesParticipation in conference

Description

RF plasma deposition of thin SiOx films onto Aluminium alloy: XPS and contact angle measurements studies, communication orale. A. Azioune, M. Marcozzi, V. Revello et J.-J. Pireaux
Period14 Nov 200419 Nov 2004
Event typeConference
LocationAnaheim, Etats-UnisShow on map