4th European Workshop on Secondary Ion Mass Spectrometry, SIMS Europe 2004

Houssiau, L. (Contributor)

Activity: Participating in or organising an event typesParticipation in conference

Description

ToF-SIMS depth profiles of HfO2/Al2O3 ultrathin multilayers, communication orale. Co-auteurs : R.G. Vitchev, T.Conard et H. Bender.
Period26 Sep 200429 Sep 2004
Event typeConference
LocationMunster, Allemagne