3rd European Workshop on Secondary Ion Mass Spectrometry, SIMS Europe 2002

Jérémy Brison (Contributor)

University of Namur

Activity: Participating in or organising an event types › Participation in conference

Description

A comparative study of cluster and elemental ion yields produced by co-sputtering various surfaces with Cs^{+ and Xe^{+ ions, poster.

Co-auteur : L. Houssiau.}The}

Period	15 Feb 2002 → 17 Sept 2002
Event type	Conference
Location	Munster, AllemagneShow on map