3rd European Workshop on Secondary Ion Mass Spectrometry, SIMS Europe 2002

  • Jérémy Brison (Contributor)

Activity: Participating in or organising an event typesParticipation in conference

Description

A comparative study of cluster and elemental ion yields produced by co-sputtering various surfaces with Cs+ and Xe+ ions, poster. Co-auteur : L. Houssiau.The
Period15 Feb 200217 Sep 2002
Event typeConference
LocationMunster, Allemagne