3rd European Workshop on Secondary Ion Mass Spectrometry, SIMS Europe

Houssiau, L. (Contributor)

Activity: Participating in or organising an event typesParticipation in conference

Description

Cs+ and Xe+ depth profiling of ultrathin SiO2 and AlO2 films of different thicknesses, communication orale. Co-auteur&
Period15 Sep 200217 Sep 2002
Event typeConference
LocationMunster, Allemagne