14th International Conference on Secondary Ion Mass Spectrometry (SIMS XIV)

Houssiau, L. (Contributor)

University of Namur

Activity: Participating in or organising an event types › Participation in conference

Description

ToF-SIMS applied to probe bixin in Bixa orellana seeds, communication orale. Co-auteurs : M. Felicissimo, C. Bittencourt et J.J. Pireaux. ToF-SIMS Depth-profiling of Hf and Al composition variations in ultrathin mixed HfO

Period	14 Sept 2003 → 19 Sept 2003
Event type	Conference
Location	San Diego CA, Etats-UnisShow on map