14th International Conference on Secondary Ion Mass Spectrometry (SIMS XIV)

Houssiau, L. (Contributor)

Activity: Participating in or organising an event typesParticipation in conference


ToF-SIMS applied to probe bixin in Bixa orellana seeds, communication orale. Co-auteurs : M. Felicissimo, C. Bittencourt et J.J. Pireaux. ToF-SIMS Depth-profiling of Hf and Al composition variations in ultrathin mixed HfO
Period14 Sep 200319 Sep 2003
Event typeConference
LocationSan Diego CA, Etats-Unis