11th European Conference on Applications of Surface and Interface Analysis (ECASIA'05)

Activity: Participating in or organising an event types › Participation in conference

Description

Cesium/xenon dual beam depth profiling : influence of the sputtering parameters on the MCsn+ emission, poster. CO-auteur : J. Brison.
Period25 Sept 2005 → 30 Sept 2005
Event typeConference
LocationVienne, AutricheShow on map